AFNOR - NF EN 62047-22
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 26 December 2014 |
| Status: | active |
| ICS Code (Semiconducting materials): | 29.045 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
NF EN 62047-22
December 26, 2014
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates
A description is not available for this item.