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VDI/VDE 2630 BLATT 1.4

Computed tomography in dimensional metrology - Measurement procedure and comparability

inactive, Most Current
Organization: VDI
Publication Date: 1 June 2010
Status: inactive
Page Count: 23
ICS Code (IT applications in other fields): 35.240.99
ICS Code (Non-destructive testing): 19.100
scope:

This guideline describes diverse measuring procedures and aims to give the user some assistance in the application of computed tomography (CT) for dimensional measurement problems. Representative tactile, optical and X-ray tomographic measuring procedures are successively described. The fundamental differences, similarities and particulars of each individual method are presented. Measuring instruments already exist which employ several of the sensor principles described here, in a single measuring device operating as a multi-sensor measuring instrument.

Document History

VDI/VDE 2630 BLATT 1.4
June 1, 2010
Computed tomography in dimensional metrology - Measurement procedure and comparability
This guideline describes diverse measuring procedures and aims to give the user some assistance in the application of computed tomography (CT) for dimensional measurement problems. Representative...

References

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