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JEDEC JESD 557

Statistical Process Control Systems

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Organization: JEDEC
Publication Date: 1 April 2015
Status: active
Page Count: 30
scope:

This standard specifies the general requirements of a statistical process control (SPC) system.

Document History

JEDEC JESD 557
April 1, 2015
Statistical Process Control Systems
This standard specifies the general requirements of a statistical process control (SPC) system.
EIA-557-A
July 1, 1995
Statistical Process Control Systems
Due to notification from the JC-14.4 subcommittee that the material contained in EIA599 has been replaced by the ISO 9000 series, the JEDEC Board of Directors, at its August 2003 meeting, approved to...

References

This document references:
JEDEC JEP 132 - Process Characterization Guideline
Published by JEDEC on August 1, 2018
This document is applicable to any manufacturing or service process (e.g., customer service, human resources, planning). It may be conducted on part of a process or on an entire process. While many...
This document references:
IPC-9191 - General Guidelines for Implementation of Statistical Process Control (SPC)
Published by IPC on November 1, 1999
This guideline describes the general provisions for implementation of SPC and is intended for use by individuals in electronics and other industries involved in the planning, implementation, and...
This document references:
ISO 10012 - Measurement Management Systems - Requirements for Measurement Processes and Measuring Equipment
Published by ISO on April 15, 2003
This International Standard specifies generic requirements and provides guidance for the management of measurement processes and metrological confirmation of measuring equipment used to support and...
This document references:
JEDEC JEP 132 - Process Characterization Guideline
Published by JEDEC on August 1, 2018
This document is applicable to any manufacturing or service process (e.g., customer service, human resources, planning). It may be conducted on part of a process or on an entire process. While many...
This document references:
EIA-738 - Guideline on the Use and Application of Cpk
Published by SAE on August 1, 2015
This document is applicable to electronic component and equipment manufacturing PURPOSE This document provides the guidelines for the utilization of Cpk as a monitor of process performance. This...
This document is referenced by:
MIL-C-49464 - CAPACITORS, CHIP, SINGLE LAYER, FIXED, PARALLEL PLATE, CERAMIC DIELECTRIC, ESTABLISHED RELIABILITY, GENERAL SPECIFICATION FOR
Published by NPFC on August 3, 1993
A description is not available for this item.
This document is referenced by:
MIL-DTL-3933 - ATTENUATORS, FIXED, SPACE LEVEL, NON-SPACE LEVEL GENERAL SPECIFICATION FOR
Published by NPFC on October 2, 2018
This specification covers the general requirements for radio and microwave frequency fixed attenuators, including chip, coaxial, leaded, and relay header attenuators (see 6.1). This specification...
This document is referenced by:
MIL-PRF-31031 - CONNECTORS, ELECTRICAL, PLUGS AND RECEPTACLES, COAXIAL, RADIO FREQUENCY, HIGH RELIABILITY, FOR FLEXIBLE AND SEMIRIGID CABLES, GENERAL SPECIFICATION FOR
Published by NPFC on May 6, 2020
Scope. This specification covers the general requirements and tests for radio frequency connectors used with flexible RF cables and certain other types of coaxial transmission lines.
This document is referenced by:
MIL-DTL-83513 - CONNECTORS, ELECTRICAL, RECTANGULAR, MICROMINIATURE, POLARIZED SHELL, GENERAL SPECIFICATION FOR
Published by NPFC on December 7, 2020
Scope. This specification covers polarized shell, microminiature, rectangular connectors.
This document is referenced by:
JEDEC JEP 142 - Obtaining and Accepting Material for Use in Hybrid/MCM Products
Published by JEDEC on May 1, 2002
This document provides guidance regarding design considerations, material assessment techniques, and recommendations for material acceptance prior to use in Hybrid / MCM Products. As part of the risk...
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