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IEEE 1671.6

Automatic Test Markup Language (ATML) Test Station Description

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Organization: IEEE
Publication Date: 26 March 2015
Status: active
Page Count: 38
scope:

This standard defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

Document History

IEEE 1671.6
March 26, 2015
Automatic Test Markup Language (ATML) Test Station Description
This standard defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance...
September 26, 2008
Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
A description is not available for this item.

References

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