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NPFC - MIL-STD-202-108

TEST METHOD STANDARD METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)

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Organization: NPFC
Publication Date: 18 April 2015
Status: active
Page Count: 6
scope:

Purpose. This test is conducted for the purpose of determining the effects on electrical and mechanical characteristics of a part, resulting from exposure of the part to an elevated ambient temperature for a specified length of time, while the part is performing its operational function. This test method is not intended for testing parts whose life is expressed in the number of operations. Evidence of deterioration resulting from this test can at times be determined by visual examination; however, the effects may be more readily ascertained by measurements or tests prior to, during, or after exposure. Surge current, total resistance, dielectric strength, insulation resistance, and capacitance are types of measurements that would show the deleterious effects due to exposure to elevated ambient temperatures.

Document History

January 21, 2020
Method 108, Life (at Elevated Ambient Temperature)
A description is not available for this item.
MIL-STD-202-108
April 18, 2015
TEST METHOD STANDARD METHOD 108, LIFE (AT ELEVATED AMBIENT TEMPERATURE)
Purpose. This test is conducted for the purpose of determining the effects on electrical and mechanical characteristics of a part, resulting from exposure of the part to an elevated ambient...

References

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