scope:

Purpose. This test is conducted for the purpose of detecting contact-chatter in electrical and electronic component parts having movable electrical contacts, such as relays, switches, circuit breakers, etc., where it is required that the contacts do not open or close momentarily, as applicable, for longer than a specified time-duration (see 4.3) under environmental test conditions, such as vibration, shock, or acceleration. This test method provides standard test procedures for monitoring such "opening of closed contacts" or "closing of open contacts".