NPFC - MIL-STD-202-306
TEST METHOD STANDARD METHOD 306, QUALITY FACTOR (Q)
| Organization: | NPFC |
| Publication Date: | 18 April 2015 |
| Status: | active |
| Page Count: | 5 |
scope:
Purpose.
The purpose of this test is to measure the quality factor, commonly called Q, of electronic parts such as capacitors and inductors. By definition, the factor Q expresses the ratio of reactance to effective resistance of a circuit element. This numerical ratio is considered a "figure of merit" for a reactive component (or a resonant circuit utilizing such components) as it is a measure of the ability of the component (or circuit) to store energy compared to the energy it wastes. For this reason, Q is called "storage factor". Q is thus equal to the inverse of the dissipation factor. Relationship also exists between Q and the properties of a tuned circuit, such as the resonant rise in voltage phenomena. Each of the relationships involving Q mentioned above can be applied to the direct or indirect measurement of Q.
Document History