ISO 17901-2
Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics
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| Organization: | ISO |
| Publication Date: | 1 July 2015 |
| Status: | active |
| Page Count: | 28 |
| ICS Code (Electronic components in general): | 31.020 |
scope:
This part of ISO 17901 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference. The materials of hologram to be measured are not restricted to any particular ones. This part of ISO 17901 does not intend to restrict manufacturing process.
Document History
ISO 17901-2
July 1, 2015
Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics
This part of ISO 17901 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index...