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NPFC - MIL-M-38510/227

MICROCIRCUITS, DIGITAL, NMOS, 16,384 BIT, ELECTRICALLY ERASABLE, PROGRAMMABLE READ-ONLY MEMORY (EEPROM), MONOLITHIC SILICON

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Organization: NPFC
Publication Date: 27 March 1987
Status: active
Page Count: 35
scope:

This specification covers the detail requirements for monolithic silicon, N-channel MOS, 2,048 words/8 bit, 5.0 volt electrically erasable programmable read only memory microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number.

The part number shall be in accordance with MIL-M-38510, and as specified herein.

The device types shall be as follows:

Device type Circuit organization Access time 01 2048 Words/8 bit 450 ns 02 2048 Words/8 bit 350 ns 03 2048 Words/8 bit 300 ns 04 2048 Words/8 bit 250 ns

The device class shall be the product assurance level as defined in MIL-M-38510.

The case outlines shall be designated as follows:

Outline letter Case outline (see MIL-M-38510, appendix C) J D-3 (24-lead, ½" × 1 ¼"), dual-in-line package X C-2 (32-terminal, .455" × .550"), rectangular chip carrier package

Supply voltage range (VCC)- - - - - - - - - - −1.0 to +7.0 V All inputs/outputs voltage range- - - - - - - −1.0 to +7.0 V Chip erase voltage range (VOE)- - - - - - - - −.03 to +22.0 V Operating case temperature range- - - - - - - −55°C to +125°C Storage temperature range - - - - - - - - - - −65°C to +150°C Continuous power dissipation- - - - - - - - - 1 Watt Lead temperature (soldering, 10 seconds)- - - +300°C Maximum junction temperature (TJ): 2/ - - - - +175°C Thermal resistance, junction to case (θJC) Case J - - - - - - - - - - - - - - - - - - - 18.0°C/W Case X - - - - - - - - - - - - - - - - - - - 5.5°C/W

Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Rome Air Development Center, RADC (RBE-2), Griffiss AFB, NY 13441, by using the self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this document or by letter.

Device Min Max Units types Supply voltages: VCC- - - - - - - - - - - - - - - - - - - - - All 4.5 5.5 V dc VSS- - - - - - - - - - - - - - - - - - - - - All 0.0 0.0 V dc High level input voltages: (VIH)- - - - - - - - - - - - - - - - - - - - All 2.0 VCC +1 V dc Low level input voltage: (VIL)- - - - - - - - - - - - - - - - - - - - All −0.5 0.8 V dc Operating case temperature (TC)- - - - - - - - All −55 +125 °C High level chip erase voltage: (VOE on OE)- - - - - - - - - - - - - - - - - All 20 22 V dc

intended Use:

Microcircuits conforming to this specification are intended for use for Government microcircuit applications (original equipment) and logistic purposes.

Document History

August 20, 2020
Microcircuits, Digital, NMOS, 16,384 BIT, Electrically Erasable, Programmable Read-Only MEMORY (EEPROM), Monolithic Silicon
A description is not available for this item.
November 9, 2010
Microcircuits, Digital, NMOS, 16,384 BIT, Electrically Erasable, Programmable Read-Only MEMORY (EEPROM), Monolithic Silicon
A description is not available for this item.
January 31, 2006
MICROCIRCUITS, DIGITAL, NMOS, 16,384 BIT, ELECTRICALLY ERASABLE, PROGRAMMABLE READ-ONLY MEMORY (EEPROM), MONOLITHIC SILICON
A description is not available for this item.
April 26, 2001
MICROCIRCUITS, DIGITAL, NMOS, 16,384 BIT, ELECTRICALLY ERASABLE, PROGRAMMABLE READ-ONLY MEMORY (EEPROM), MONOLITHIC SILICON
A description is not available for this item.
July 24, 1995
MICROCIRCUITS, DIGITAL, NMOS, 16,384 BIT, ELECTRICALLY ERASABLE, PROGRAMMABLE READ-ONLY MEMORY (EEPROM), MONOLITHIC SILICON
A description is not available for this item.
MIL-M-38510/227
March 27, 1987
MICROCIRCUITS, DIGITAL, NMOS, 16,384 BIT, ELECTRICALLY ERASABLE, PROGRAMMABLE READ-ONLY MEMORY (EEPROM), MONOLITHIC SILICON
This specification covers the detail requirements for monolithic silicon, N-channel MOS, 2,048 words/8 bit, 5.0 volt electrically erasable programmable read only memory microcircuits. Two product...

References

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