IEC 63003
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505
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| Organization: | IEC |
| Publication Date: | 1 December 2015 |
| Status: | active |
| Page Count: | 176 |
| ICS Code (Industrial automation systems): | 25.040 |
scope:
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.
Purpose
Standardization of a common input/output (I/O) will enable the interoperability of IEEE 1505 compliant interface fixtures [also known as interface test adapters (ITA), interface devices (IDs), or interconnecting devices (ICDs)] on multiple ATE systems utilizing the IEEE 1505 RFI.
Document History
IEC 63003
December 1, 2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace...