JEDEC - EIA-398
Measurement of Small Values of Transistor Capacitance
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| Organization: | JEDEC |
| Publication Date: | 1 January 1972 |
| Status: | inactive |
| Page Count: | 12 |
scope:
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as RS-398 and/or EIA-398
Document History
July 1, 1972
Measurement of Small Values of Transistor Capacitance
Introduction
Transistor capacitances are usually measured on two-terminal capacitance or impedance bridges. When the capacitances are in the low picofarad ranges, this two terminal measurement is...
EIA-398
January 1, 1972
Measurement of Small Values of Transistor Capacitance
This standard contains a three-terminal procedure for capacitance measurement with due precautions for shielding of extraneous effects due to terminal leads and metal enclosures. Formerly known as...
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