BSI - BS IEC 63003
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505 TM
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| Organization: | BSI |
| Publication Date: | 31 January 2016 |
| Status: | active |
| Page Count: | 174 |
| ICS Code (Industrial automation systems in general): | 25.040.01 |
Document History
BS IEC 63003
January 31, 2016
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505 TM
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