scope:

This generic specification applies to electromechanical sockets of assessed quality for use in direct current, analog, and digital applications. This generic specification shall be used in conjunction with the basic specification EIA-364 "Electrical Connector Test Procedures including Environmental Classifications".

Socket types

Types of sockets covered by this specification include, but are not necessarily limited to, the following types:

a) chip carrier sockets

b) pin grid array sockets

c) relay sockets

d) dual-in-line sockets

e) transistor outline (TO) sockets

f) multi-package module sockets

g) burn-in sockets

h) ball grid array sockets

i) to be assigned

Socket types shall be described in sectional specifications that will reference this generic specification. Blank detail specifications, from which a detail specification may be developed by filling in the relevant performance data, will reference the applicable sectional specification. In lieu of blank detail specifications, the sectional specification may provide instructions for the preparation of detail specifications.

Order of precedence

In the event of conflict between this generic specification and/or a sectional specification and the detail specification, the requirements of the detail specification shall prevail (provided the requirements of the detail specification are not considered to have diminished the requirements mandated by the sectional or generic specifications).

Objective

The objective of this generic specification is to establish a uniform quality assessment system, a uniform qualification test sequence, a uniform numbering system and to provide consistency in sectional specifications for electromechanical sockets.