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BS 3042 - Test Probes to Verify Protection by Enclosures
August 15, 1992 - BSI

Gives details and dimensions of test probes intended to verify the protection provided by enclosure with regard to: a) protection of persons against access to hazardous parts inside the enclosure. b) protection of equipment inside the enclosure against ingress of solid foreign objects.

SAE ITC TS351 - Test for Electrical Connectors - Test Probe Damage
August 1, 1985 - SAE-ITC
A description is not available for this item.
ISO DIS 2100-415 - Aerospace elements of electrical and optical connection - Test methods - Part 415: Test probe damage (female contact)
August 3, 2017 - ISO

This standard specifies a method of checking that the elastic system which ensures electrical contact is not damaged by the insertion of a test probe. It shall be used together with ISO 2100-100.

DS/EN 2591-415 - Aerospace series - Elements of electrical and optical connection - Test methods - Part 415: Test probe damage (female contacts)
December 21, 2001 - DS

This standard specifies a method of checking that the female contacts used in elements of electrical and optical connection are not damaged by the insertion of a test probe. It shall be used together with EN 2591-100.

ISO DIS 2100-6415 - Aerospace elements of electrical and optical connection - Test methods - Part 6415: Optical elements - Test probe damage
August 3, 2017 - ISO

This standard specifies a method of checking that the alignment system used for optical connection elements is not damaged by the insertion of a specified probe. It shall be used together with ISO 2100-100.

DS/EN 2591-6415 - Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415: Optical elements - Test probe damage
January 24, 2002 - DS

This standard specifies a method of checking that the alignment system used for optical connection elements is not damaged by the insertion of a specified probe. It shall be used together with EN 2591-100.

EIA-364-25 - TP-25E Probe Damage Test Procedure for Electrical Connectors
March 1, 2017 - ECIA

This standard establishes a test method to be followed for probe damage testing; intended primarily for round socket contacts in electrical connectors and possibly applicable to other type contacts as well. This test is to simulate a form of field abuse of...

MS 3321 - TEST FIXTURE, PROBE DAMAGE, SOCKET CONTACT, CONNECTOR, ELECTRIC
NPFC
A description is not available for this item.
IEEE 1696 - Terminology and Test Methods for Circuit Probes
December 11, 2013 - IEEE

This standard provides test method(s) and describes transfer (artifact) standards for characterizing electrical circuit probes and probes systems. The systems may include waveform acquisition hardware and software and signal/waveform analysis software. The probe...

NFPA ELECTRICAL - ELECTRICAL INSPECTION MANUAL
NFPA
A description is not available for this item.
EIA SP 3713 - PROBE DAMAGE TEST PROCEDURE FOR ELECTRICAL CONNECTORS
ECIA
A description is not available for this item.
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