loading
ASTM F1467-18 - Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
March 1, 2018 - ASTM International

4.1 Electronic circuits used in many space, military and nuclear power systems may be exposed to various levels of ionizing radiation dose. It is essential for the design and fabrication of such circuits that test methods be available that can determine the vulnerability or hardness (measure...

ASTM F1467 - Standard Guide for Use of an X-Ray Tester ('10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
March 1, 2018 - ASTM

This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation. The X-ray...

ASTM F1467-11 - Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
October 1, 2011 - ASTM International

Electronic circuits used in many space, military and nuclear power systems may be exposed to various levels of ionizing radiation dose. It is essential for the design and fabrication of such circuits that test methods be available that can determine the vulnerability or hardness (measure of...

ASTM F1467-99(2005)e1 - Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
January 1, 2005 - ASTM International

Electronic circuits used in many space, military and nuclear power systems may be exposed to various levels of ionizing radiation dose. It is essential for the design and fabrication of such circuits that test methods be available that can determine the vulnerability or hardness (measure of...

ASTM F1467-99(2005) - Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
January 1, 2005 - ASTM International

1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having [approximate]10 keV mean photon energy and [approximate]50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing...

ASTM F1467-99 - Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
January 10, 1999 - ASTM International

1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having [approximate]10 keV mean photon energy and [approximate]50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing...

Advertisement