5.1 This test method is used to determine the mechanical properties in flexure of engineered ceramic components with multiple longitudinal hollow channels, commonly described as "honeycomb" channel architectures. The components generally have 30?% or more porosity and the cross-sectional dimensions...
This part of IEC 61810, with functional and safety aspects, applies to electromechanical elementary relays (non-specified time all-or-nothing relays) with high capability requirements like breaking or short circuit capabilities and similar for incorporation into low-voltage equipment. These relays...
This part of IEC 61810, which functional aspects and safety requirements, applies to high capacity/performance
This part of IEC 61810, with functional and safety aspects, applies to electromechanical elementary relays (non-specified time all-or-nothing relays) with high capability requirements like breaking or short circuit capabilities and similar for incorporation into low-voltage equipment. These relays...
4.1 An MFS has similar properties to a load cell or strain gauge. However, an MFS is not suitable for precision measurements. 4.2 MFS pressure versus resistance data can be calculated if the force probe is providing uniform pressure over a distributed area or if the sensor is exposed...
5.1 This test method is used to determine the mechanical properties in flexure of engineered ceramic components with multiple longitudinal hollow channels, commonly described as "honeycomb" channel architectures. The components generally have 30 % or more porosity and the cross-sectional dimensions...
This test method is used to determine the mechanical properties in flexure of engineered ceramic components with multiple longitudinal hollow channels, commonly described as "honeycomb" channel architectures. The components generally have 30 % or more porosity and the cross-sectional dimensions of...
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is clamped to a mating port (referred to as a wall port) cut in the top or bottom of a transverse...
This test method is used to determine the mechanical properties in flexure of engineered ceramic components with multiple longitudinal hollow channels, commonly described as "honeycomb" channel architectures. The components generally have 30 % or more porosity and the cross-sectional dimensions of...