Microscope Standards

1.1 This test method covers a procedure for measuring in-plane lengths (including deflections) of patterned thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric...

1.1 This test method covers a procedure for measuring the compressive residual strain in thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

1.1 This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

1.1 This guide outlines various methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes. 1.2...

This clause of Part 1 is replaced by the following. This International Standard deals with the safety of electric projectors and similar appliances for household and similar purposes, their rated voltage being not more than 250 V. NOTE 101 Examples of appliances that are within the scope of this...

1.1 This test method covers a procedure for measuring in-plane lengths (including deflections) of patterned thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric...

This test method covers a procedure for measuring in-plane lengths (including deflections) of patterned thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric...

1.1 This test method covers a procedure for measuring the compressive residual strain in thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

1.1 This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

1.1 This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

This test method covers a procedure for measuring the strain gradient in thin, reflecting films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

This test method covers a procedure for measuring the compressive residual strain in thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer, also called an interferometric microscope....

1.1 This test method covers a procedure for measuring in-plane lengths (including deflections) of patterned thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer. 1.2 There are other ways to...

1.1 This guide outlines various methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes. 1.2...

This guide outlines various methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes. Guidelines...

1.1 This guide outlines various methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes. 1.2...

1.1 This test method covers a procedure for measuring in-plane lengths (including deflections) of patterned thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an optical interferometer. 1.2 There are other ways to...

1.1 This guide outlines various methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes. 1.2...

1.1 This test method covers a procedure for measuring in-plane lengths (including deflections) of patterned thin films. It applies only to films, such as found in microelectromechanical systems (MEMS) materials, which can be imaged using an interferometer. 1.2 There are other ways to determine...

1.1 This guide outlines various suggested methods which may be followed in the photography of metals and materials with the reflected-light microscope. Methods are included for preparation of prints and transparencies in black-and-white and in color, using both direct rapid and wet processes...