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JIS OPTICAL INSTRUMENTS - JIS Optical Instruments Handbook
January 1, 2013 - JSA
A description is not available for this item.
IEEE MAGNETO-OPTICAL - MAGNETO-OPTICAL RECORDING MATERIALS
IEEE
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DIN EN ISO 8503-3 - Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile - Focusing microscope procedure (ISO 8503-3:2012)
June 1, 2012 - DIN

This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1. This part of ISO 8503 is also applicable to the determination of the surface profile, within the range hy =...

DS/EN ISO 8503-3 - Preparation of steel substrates before application of paints and related products - Surface roughness characteristics of blast-cleaned steel substrates - Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile - Focusing microscope procedure
March 19, 2012 - DS

This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503-1. This part of ISO 8503 is also applicable to the determination of the surface profile, within the range hy =...

ISO 8503-3 - Preparation of steel substrates before application of paints and related products — Surface roughness characteristics of blast-cleaned steel substrates — Part 3: Method for the calibration of ISO surface profile comparators and for the determination of surface profile — Focusing microscope procedure
February 15, 2012 - ISO

This part of ISO 8503 specifies the optical microscope and describes the procedure for calibrating ISO surface profile comparators conforming to the requirements of ISO 8503‑1. This part of ISO 8503 is also applicable to the determination of the surface profile, within the range hy =...

Advanced Signal Processing
January 1, 1985 - IET

The book reviews developments in the following fields:transmitter aerial; high power amplifier design; radar transmitter; receiver array technology; underwater acoustic sensor; diversity techniques in communications receivers; GaAs IC amplifiers; integrated optical technique; logarithmic...

BS 1054 - Specification for Engineers’ comparators for external measurement
June 30, 1975 - BSI

Design, construction and performance accuracy of comparators primarily comprising a rigid stand supporting a measuring head over a work table, the movements of the measuring tip being amplified by mechanical, electrical, electronic, optical, fluid or pneumatic means and indicated on a...

IEC 61243-5 - Live working - Voltage detectors - Part 5: Voltage detecting systems (VDS)
June 1, 1997 - IEC

This part of IEC 61243 is applicable to voltage detecting systems that are single-pole and are capacitively-coupled to live parts. They are used to detect the presence or absence of operating voltage on a.c. electrical systems for voltages from 1 kV to 52 kV, and for frequencies from 162/3 Hz to 60...

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