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MIL-PRF-55310 - OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
November 20, 2018 - NPFC

This specification covers the general requirements for quartz crystal oscillators used in electronic equipment.

QPL-55310 - OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
October 25, 2018 - NPFC

QUALIFIED PRODUCTS LIST OF PRODUCTS QUALIFIED UNDER PERFORMANCE SPECIFICATION MIL-PRF-55310 OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR This list has been prepared for use by or for the Government in the acquisition of products covered by Specification MIL-PRF-55310. Listing of...

DS/EN IEC 62884-3 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods
May 28, 2018 - DS

IEC 62884-3:2018(E) describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as...

IEC 62884-3 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods
March 1, 2018 - IEC

This part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as...

Amplifiers, Comparators, Multipliers, Filters, and Oscillators
September 11, 2018 - CRC
A description is not available for this item.
DS/EN 62884-2 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 2: Phase jitter measurement method
December 4, 2017 - DS

IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator...

DSCC-DWG-05014 - OSCILLATOR, CRYSTAL CONTROLLED, 5 VOLT, ENABLE/TRI-STATE, 312KHZ TO 120 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
November 14, 2017 - DOD

This drawing describes the requirements of a enable/tri-state, miniature, surface mount crystal controlled oscillator with a frequency range of 312 kilohertz (kHZ) to 120 megahertz (MHz), TTL and CMOS compatible, rated at 5 volts, meeting the requirements of MIL-PRF-55310 product level B,...

DSCC-DWG-05013 - OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 312KHZ TO 170 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
November 14, 2017 - DOD

This drawing describes the requirements of a enable/tri-state, miniature, surface mount crystal controlled oscillator with a frequency range of 312 kilohertz (kHZ) to 170 megahertz (MHz), TTL and CMOS compatible, rated at 3.3 volts, meeting the requirements of MIL-PRF-55310 product level B,...

DSCC-DWG-13018 - OSCILLATOR, CRYSTAL CONTROLLED, 3.3 VOLT, ENABLE/TRI-STATE, 32.768 KHZ TO 160 MHZ, TTL AND CMOS COMPATIBLE, SURFACE MOUNT
November 6, 2017 - DOD

This drawing describes the requirements of a enable/tri-state, miniature, surface mount crystal controlled oscillator with a frequency range of 32.768 kilohertz (kHz) to 160 megahertz (MHz), TTL and CMOS compatible, rated at 3.3 volts, meeting the requirements of MIL-PRF-55310 product level...

DS/EN 60679-1 - Piezoelectric, dielectric and electrostatic oscillators of assessed quality – Part 1: Generic specification
November 20, 2017 - DS

IEC 60679-1:2017(E) specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either...

DS/EN 62884-1 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 1: Basic methods for the measurement
September 25, 2017 - DS

IEC 62884-1:2017(E) specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")

DIN EN 62884-2 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method (IEC 62884-2:2017); German version EN 62884-2:2017
May 1, 2018 - DIN

Dieser Teil von IEC 62884 legt die Verfahren zur Messung und Evaluierung des Phasenjitters piezoelektrischer, dielektrischer und elektrostatischer Oszillatoren, einschließlich Oszillatoren mit dielektrischem Resonator (DROs) und Oszillatoren mit Dünnschicht-Volumenwellen-Resonator (FBAR)...

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