There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. The latter is frequently called thermally stimulated depolarization current (TSDC)....
This part of IEC TS 62607 establishes a standardized method to determine the structural key control characteristic - domain size for films consisting of graphene grown by chemical vapour deposition (CVD) on copper by - substrate oxidation. It provides a fast, facile and reliable method to...
This part of IEC 62607, which is a Technical Specification, provides a method for determining the fluorescence lifetime of semiconductor quantum dots (QDs) using the time correlated single photon counting (TCSPC) technique. TCSPC is suitable for testing fluorescence lifetime in the range...
This part of IEC 62899 specifies a test method for displacement current measurement (DCM) for printed thin-film transistors (TFTs) or organic thin-film transistors (OTFTs).
This part of IEC TS 62607, which is a Technical Specification, specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semi
There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. This part of IEC 62607 focuses on the former method, and specifies the...
This part of IEC 62607 specifies the test method for determining the resistivity and the contact resistance of an individual CNT and the dependability of the measurement. This document includes: - outlines of the experimental procedures used to measure resistance of carbon nanotubes, -...
This part of IEC 62607, which is a Technical Specification, specifies a test method for the determination of water content in electrode nanomaterials for nano-enabled electrical energy storage devices, using the Karl Fischer coulometric titration method. This document includes: -...
This part of IEC 60146, which is a Technical Report, gives guidance on variations to the specifications given in IEC 60146-1-1:2009 to enable the specification to be extended in a controlled form for special cases. Background information is also given on technical points, which...
This part of IEC 60146, which is a Technical Report, gives guidance on variations to the specifications given in IEC 60146-1-1:2009 to enable the specification to be extended in a controlled form for special cases. Background information is also given on technical points, which...
This part of IEC 60404 specifies the measurement and test methods for the determination of the following geometrical characteristics of electrical steel strip and sheet: - edge wave (wave factor); - residual curvature; - edge camber; - deviation from the shearing line (internal stress); -...
This part of IEC 62899 defines terms and specifies standard methods for characterisation and evaluation. This document is applicable to semiconductor inks and semiconductive layers that are made from semiconductor inks.
This part of IEC TS 62607 provides a method for the determination of magnetic impurities in anode nanomaterials for energy storage devices using an Inductively Coupled Plasma Optical Emission Spectrometer (ICP-OES), including test overview, reagents, apparatus, test procedures, test results...
This part of IEC 62565, which is a Technical Specification, specifies the essential general and optical requirements of monodisperse luminescent nanomaterials used in general lighting and display products to enable their reliable mass production and quality control during the manufacturing...
This part of IEC 62607, which is a Technical Specification, provides a method for determination of carbon content of nano electrode materials by infrared absorption spectroscopy method. The method is applicable to carbon contents of mass fraction between 0,001 % and 100 %. This method will...
This part of IEC 62607 provides a standardized method for the determination of electrochemical properties of cathode nanomaterials such as lithium iron phosphate (LFP) for electrical energy storage devices. This method will enable the industry to: a) decide whether or not a cathode...
Purpose This document is written with the intention of providing an understanding of analyser maintenance principles and approaches. It is designed as a reference source for individuals closely involved with maintenance of analytical instrumentation, and provides guidance on performance target...
This part of IEC 62607 establishes a method for determining the surface conductance of twodimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC),...
This document provides terms and definitions for "low-halogen" electronic products that have the potential to contain the halogens bromine (Br) and chlorine (Cl) from the use of BFRs, CFRs, and PVC, and recommends methods for marking and labeling. This standard may be applied to all nonmetallic and...
This International Standard provides a framework for introducing nanoelectronics into large scale, high volume production in semiconductor manufacturing facilities through the incorporation of nanomaterials (e.g. carbon nanotubes, graphene, quantum dots, etc.). Since semiconductor manufacturing...