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Semiconducting Polymers
January 1, 1999 - WILEY

Semiconducting Polymers Chemistry, Physics and Engineering Edited by G. Hadziioannou and P. F. van Hutten The field of semiconducting polymers has attracted many researchers from a diversity of disciplines. While, on the one hand, some of the foreseen applications are already being...

Microscopy of Semiconducting Materials 2003
December 13, 2017 - CRC

Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of...

DIN ISO 22197-1 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 1: Removal of nitric oxide (ISO 22197-1:2016)
December 1, 2018 - DIN

This document specifies a test method for the determination of the air-purification performance of materials that contain a photocatalyst or have photocatalytic films on the surface, usually made from semiconducting metal oxides, such as titanium dioxide or other ceramic...

ISO 22197-5 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 5: Removal of methyl mercaptan
April 1, 2013 - ISO

This part of ISO 22197 specifies a test method for the determination of the air-purification performance of materials that contain a photocatalyst or have photocatalytic films on the surface, usually made from semiconducting metal oxides, such as titanium dioxide or other...

ISO 22197-4 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials - Part 4: Removal of formaldehyde
April 1, 2013 - ISO

This part of ISO 22197 specifies a test method for the determination of the air-purification performance of materials that contain a photocatalyst or have photocatalytic films on the surface, usually made from semiconducting metal oxides, such as titanium dioxide or other...

ISO 10677 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
July 1, 2011 - ISO

This International Standard describes an ultraviolet (UV) light source and specifies a method of measuring the radiation intensity which is used in testing the performance of semiconducting photocatalytic materials in a laboratory.

ISO 22601 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for determination of phenol oxidative decomposition performance of semiconducting photocatalytic materials by quantitative analysis of total organic carbon (TOC)
September 1, 2019 - ISO

This document provides a testing method for testing phenol oxidative decomposition performance of semiconducting photocatalytic materials or made of a material adsorbed with photocatalyst to its surface for the purpose of purifying water polluting substances in water making use...

ISO 19722 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for determination of photocatalytic activity on semiconducting photocatalytic materials by dissolved oxygen consumption
January 1, 2017 - ISO

This document specifies the test method for determination of concentration of dissolved oxygen consumed due to photocatalytic oxidation of phenol in aqueous phase by semiconducting photocatalytic substances. The method is applicable to powder test sample or film test piece of...

ISO 18560-1 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for air-purification performance of semiconducting photocatalytic materials by test chamber method under indoor lighting environment - Part 1: Removal of formaldehyde
November 15, 2014 - ISO

This part of ISO 18560 specifies a test method for the determination of the air-purification performance of materials that contain a indoor-light-active photocatalyst or have indoor-light-active photocatalytic films on the surface, usually made from semiconducting metal oxides,...

ISO 14605 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
October 15, 2013 - ISO

This International Standard specifies the light source and radiometer used in the performance evaluation of semiconducting photocatalytic materials used under an indoor lighting environment in a laboratory. A light source of an indoor lighting environment does not include the sunlight...

ISO 27447 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antibacterial activity of semiconducting photocatalytic materials
July 1, 2019 - ISO

This document specifies a test method for the determination of the antibacterial activity of materials that contain a photocatalyst or have photocatalytic films on the surface, by measuring the enumeration of bacteria under irradiation of ultraviolet light. This document is intended for use...

ASTM D6095-12(2023) - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
May 1, 2023 - ASTM International

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test...

ASTM D6095-12(2018) - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
November 1, 2018 - ASTM International

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test...

Tuning Semiconducting and Metallic Quantum Dots: Spectroscopy and Dynamics
March 27, 2017 - CRC

Nanotechnology is one of the growing areas of this century, also opening new horizons for tuning optical properties. This book introduces basic tuning schemes, including those on a single quantum object level, with an emphasis on surface and interface manipulation of semiconducting and...

ASTM D6095-12 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
November 1, 2012 - ASTM International

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test...

ASTM D6095-06 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
April 1, 2006 - ASTM International

The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D...

ICEA T-32-645 - Test Method for Establishing Volume Resistivity Compatibility of Water Blocking Components With Extruded Semiconducting Shield Materials
January 1, 2012 - ICEA

This test method provides procedures for establishing volume resistivity compatibility of water blocking components with extruded semiconducting shields utilized in MV, HV or EHV power cables. The compatibility test is designed to verify that the electrical properties of a...

ISO 19652 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for complete decomposition performance of semiconducting photocatalytic materials under indoor lighting environment - Decomposition of acetaldehyde
April 1, 2018 - ISO

This document specifies a test method for the determination of complete decomposition performance of indoor light-active photocatalytic materials under an indoor lighting environment using acetaldehyde. In this document, photocatalytic materials are usually made from...

Transparent Semiconducting Oxides Bulk Crystal Growth and Fundamental Properties
September 1, 2020 - CRC

This book presents a collection of a number of transparent semiconducting oxides (TSOs) that were grown as bulk single crystals using diverse growth techniques and discusses the fundamental properties gathered directly from the bulk crystals. Properties of bulk crystals are closer to the...

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