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Microscopy of Semiconducting Materials 2003
December 13, 2017 - CRC

Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of...

Semiconducting Polymers
January 1, 1999 - WILEY

Semiconducting Polymers Chemistry, Physics and Engineering Edited by G. Hadziioannou and P. F. van Hutten The field of semiconducting polymers has attracted many researchers from a diversity of disciplines. While, on the one hand, some of the foreseen applications are already being...

ISO 10677 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials
July 1, 2011 - ISO

This International Standard describes an ultraviolet (UV) light source and specifies a method of measuring the radiation intensity which is used in testing the performance of semiconducting photocatalytic materials in a laboratory.

ASTM D6095-12(2023) - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
May 1, 2023 - ASTM International

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test...

ASTM D6095-12(2018) - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
November 1, 2018 - ASTM International

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test...

Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987
October 1, 1987 - CRC

The various forms of microscopy and related microanalytical techniques are making unique contributions to semiconductor research and development that underpin many important areas of microelectronics technology. Microscopy of Semiconducting Materials 1987 highlights the progress that...

ISO 14605 - Fine ceramics (advanced ceramics, advanced technical ceramics) - Light source for testing semiconducting photocatalytic materials used under indoor lighting environment
October 15, 2013 - ISO

This International Standard specifies the light source and radiometer used in the performance evaluation of semiconducting photocatalytic materials used under an indoor lighting environment in a laboratory. A light source of an indoor lighting environment does not include the...

ISO 27447 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for antibacterial activity of semiconducting photocatalytic materials
July 1, 2019 - ISO

This document specifies a test method for the determination of the antibacterial activity of materials that contain a photocatalyst or have photocatalytic films on the surface, by measuring the enumeration of bacteria under irradiation of ultraviolet light. This document is intended for use...

ISO 27448 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Test method for self-cleaning performance of semiconducting photocatalytic materials — Measurement of water contact angle
July 15, 2009 - ISO

This International Standard deals with fine ceramics. This International Standard specifies a test method for the determination of the self-cleaning performance of materials that contain a photocatalyst or have photocatalytic films on the surface, and which are usually made...

Tuning Semiconducting and Metallic Quantum Dots: Spectroscopy and Dynamics
March 27, 2017 - CRC

Nanotechnology is one of the growing areas of this century, also opening new horizons for tuning optical properties. This book introduces basic tuning schemes, including those on a single quantum object level, with an emphasis on surface and interface manipulation of semiconducting and...

ASTM D6095-12 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
November 1, 2012 - ASTM International

4.1 The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test...

ISO 18061 - Fine Ceramics (Advanced Ceramics, Advanced Technical Ceramics) - Determination of antiviral activity of semiconducting photocatalytic materials - Test method using bacteriophage Q-beta
June 1, 2014 - ISO

The test method in this International Standard specifies the determination of the antiviral activity of materials that contain photocatalytic materials or have photocatalytic films on the surface, by enumerating the destruction of bacteriophage Q-beta after irradiation of...

ASTM D6095-06 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
April 1, 2006 - ASTM International

The electrical behavior of semiconducting extruded shielding materials is important for a variety of reasons, such as safety, static charges, and current transmission. This test method is useful in predicting the behavior of such semiconducting compounds. Also see Test Method D...

ICEA T-32-645 - Test Method for Establishing Volume Resistivity Compatibility of Water Blocking Components With Extruded Semiconducting Shield Materials
January 1, 2012 - ICEA

This test method provides procedures for establishing volume resistivity compatibility of water blocking components with extruded semiconducting shields utilized in MV, HV or EHV power cables. The compatibility test is designed to verify that the electrical properties of a...

ASTM D6095 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
November 1, 2012 - ASTM

This test method covers the procedure for determining the volume resistivity, measured longitudinally, of extruded crosslinked and thermoplastic semiconducting, conductor and insulation shields for wire and cable. In common practice the conductor shield is often referred to as the strand...

Transparent Semiconducting Oxides Bulk Crystal Growth and Fundamental Properties
September 1, 2020 - CRC

This book presents a collection of a number of transparent semiconducting oxides (TSOs) that were grown as bulk single crystals using diverse growth techniques and discusses the fundamental properties gathered directly from the bulk crystals. Properties of bulk crystals are closer to the...

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