CEN - EN ISO 18452
Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
active, Most Current
| Organization: | CEN |
| Publication Date: | 1 April 2016 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Advanced ceramics): | 81.060.30 |
scope:
This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm
NOTE The method requires a distinct and clearly formed boundary between coated and uncoated parts of the substrate.
Document History
EN ISO 18452
April 1, 2016
Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer
This International Standard specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film...