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ISO 3274

Geometrical Products Specifications (GPS) - Surface Texture: Profile Method - Nominal Characteristics of Contact (Stylus) Instruments

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Organization: ISO
Publication Date: 1 December 1996
Status: active
Page Count: 19
ICS Code (Measuring instruments): 17.040.30
scope:

This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder).

NOTES

1 A data sheet dealing with characteristics of contact (stylus) instruments to be completed by the instrument makers is under preparation and will be introduced in a future standard on calibration procedures.

2 The relationships between the waviness cut-off λf, tip radius and waviness cut-off ratio are under consideration and will be added to this International Standard as an amendment.

Document History

ISO 3274
December 1, 1996
Geometrical Products Specifications (GPS) - Surface Texture: Profile Method - Nominal Characteristics of Contact (Stylus) Instruments
This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be...
January 1, 1975
Instruments for the Measurement of Surface Roughness by the Profile Method - Contact (Stylus) Instruments of Consecutive Profile Transformation - Contact Profile Meters, System M First Edition
A description is not available for this item.

References

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