DLA - DSCC-VID-V62/04729 REV B
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
active, Most Current
| Organization: | DLA |
| Publication Date: | 15 September 2016 |
| Status: | active |
| Page Count: | 16 |
scope:
This drawing documents the general requirements of a high performance 3.3-V ABT scan test device with 18-bit universal bus transceiver microcircuit, with an operating temperature range of -40°C to +85°C.
Document History
DSCC-VID-V62/04729 REV B
September 15, 2016
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance 3.3-V ABT scan test device with 18-bit universal bus transceiver microcircuit, with an operating temperature range of -40°C to...
August 22, 2011
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance 3.3-V ABT scan test device with 18-bit universal bus transceiver microcircuit, with an operating temperature range of -40°C to...
June 9, 2004
MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 3.3-V ABT SCAN TEST DEVICE WITH 18-BIT UNIVERSAL BUS TRANSCEIVER, MONOLITHIC SILICON
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