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BSI - BS EN 60749-44

Semiconductor devices — Mechanical and climatic test methods Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

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Organization: BSI
Publication Date: 30 November 2016
Status: active
Page Count: 26
ICS Code (Semiconductor devices in general): 31.080.01

Document History

BS EN 60749-44
November 30, 2016
Semiconductor devices — Mechanical and climatic test methods Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
A description is not available for this item.

References

This document references:
EN 60749-38 - Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory
Published by CENELEC on May 1, 2008
A description is not available for this item.
This document references:
IEC 60749-38 - Semiconductor devices – Mechanical and climatic test methods – Part 38: Soft error test method for semiconductor devices with memory
Published by IEC on February 1, 2008
A description is not available for this item.
This document references:
IEC 62396-4 - Process management for avionics – Atmospheric radiation effects – Part 4: Design of high voltage aircraft electronics managing potential single event effects
Published by IEC on September 1, 2013
This part of IEC 62396 provides guidance on atmospheric radiation effects and their management on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up...
This document references:
IEC 62396-5 - Process management for avionics – Atmospheric radiation effects – Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
Published by IEC on August 1, 2014
The purpose of this part of IEC 62396 is to provide a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in...
This document references:
JEDEC JESD 89 - Test Method for Real-Time Soft Error Rate
Published by JEDEC on October 1, 2007
This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or...
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