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DOD - SMD 5962-07215

MICROCIRCUIT, LINEAR, BiCMOS, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 14 September 2017
Status: active
Page Count: 22
scope:

This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

August 16, 2022
MICROCIRCUIT, LINEAR, BiCMOS, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-07215
September 14, 2017
MICROCIRCUIT, LINEAR, BiCMOS, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
January 31, 2012
MICROCIRCUIT, LINEAR, BiCMOS, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 14, 2010
MICROCIRCUIT, LINEAR, BiCMOS, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
January 29, 2008
MICROCIRCUIT, LINEAR, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
December 18, 2007
MICROCIRCUIT, LINEAR, RADIATION HARDENED, DUAL HIGH SPEED, VOLTAGE COMPARATOR, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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