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ISO 17915

Optics and photonics - Measurement method of semiconductor lasers for sensing

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Organization: ISO
Publication Date: 1 May 2018
Status: active
Page Count: 36
ICS Code (Optoelectronics. Laser equipment): 31.260
scope:

This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.

This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.

Document History

ISO 17915
May 1, 2018
Optics and photonics - Measurement method of semiconductor lasers for sensing
This document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing...

References

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