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NPFC - MIL-PRF-55310/33

OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS

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Organization: NPFC
Publication Date: 8 January 2018
Status: active
Page Count: 7

Document History

MIL-PRF-55310/33D VALID NOTICE 1
November 29, 2022
Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 500 KHz Through 85 MHz, Hermetic Seal, CMOS
A description is not available for this item.
MIL-PRF-55310/33
January 8, 2018
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
A description is not available for this item.
MIL-PRF-55310/33
February 1, 2013
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
A description is not available for this item.
MIL-PRF-55310/33
April 19, 2010
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 KHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
A description is not available for this item.
MIL-PRF-55310/33
July 10, 2007
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 kHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
A description is not available for this item.
MIL-PRF-55310/33
January 19, 2007
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 500 kHz THROUGH 85 MHz, HERMETIC SEAL, CMOS
A description is not available for this item.
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References

This document references:
MIL-STD-202-105 - Method 105, Barometric Pressure (Reduced)
Published by NPFC on January 21, 2020
A description is not available for this item.
This document references:
MIL-STD-202-204 - TEST METHOD STANDARD METHOD 204, VIBRATION, HIGH FREQUENCY
Published by NPFC on April 18, 2015
Purpose. The high frequency vibration test is performed for the purpose of determining the effect on component parts of vibration in the frequency ranges of 10 to 500 hertz (Hz), 10 to 2,000 Hz or 10...
This document references:
MIL-STD-202-211 - TEST METHOD STANDARD METHOD 211, TERMINAL STRENGTH
Published by NPFC on December 15, 2020
Purpose. This test is performed to determine whether the design of the terminals and their method of attachment can withstand one or more of the applicable mechanical stresses to which they will be...
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