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DOD - SMD 5962-95626

MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 14 February 2018
Status: active
Page Count: 18
scope:

This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V), and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class T, the user is encouraged to review the manufacturers Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-95626
February 14, 2018
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V), and for appropriate satellite and similar applications...
June 22, 2017
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V), and for appropriate satellite and similar applications...
March 4, 2010
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V), and for appropriate satellite and similar...
February 12, 2004
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
A description is not available for this item.
June 24, 1999
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V), and for appropriate satellite and similar...
December 2, 1998
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V), and for appropriate satellite and similar...
September 22, 1997
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
A description is not available for this item.
January 24, 1996
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
A description is not available for this item.
October 5, 1995
MICROCIRCUIT, MEMORY, DIGITAL, RADIATION HARDENED, CMOS, 8K X 8-BIT PROM, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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