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BSI - BS DD IEC/TS 62215-2

Integrated Circuits - Measurement of Impulse Immunity - Part 2: Synchronous Transient Injection Method

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Organization: BSI
Publication Date: 30 November 2007
Status: active
Page Count: 28
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS DD IEC/TS 62215-2
November 30, 2007
Integrated Circuits - Measurement of Impulse Immunity - Part 2: Synchronous Transient Injection Method
A description is not available for this item.

References

This document references:
IEC 61000-4-5 - Electromagnetic compatibility (EMC) – Part 4-5: Testing and measurement techniques – Surge immunity test
Published by IEC on August 1, 2017
Scope and object This part of IEC 61000 relates to the immunity requirements, test methods, and range of recommended test levels for equipment with regard to unidirectional surges caused by...
This document references:
IEC 61000-4-2 - Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement techniques – Electrostatic discharge immunity test
Published by IEC on December 1, 2008
This International Standard relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and to...
This document references:
IEC 62132-4 - Integrated circuits – Measurement of electromagnetic immunity 150 kHz to 1 GHz – Part 4: Direct RF power injection method
Published by IEC on February 1, 2006
This part of IEC 62132 describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method...
This document references:
IEC 60050-161 - Amendment 2 International Electrotechnical Vocabulary Chapter 161: Electromagnetic Compatibility
Published by IEC on April 1, 1998
A description is not available for this item.
This document references:
IEC 60050-131 - AMENDMENT 1 International Electrotechnical Vocabulary – Part 131: Circuit theory
Published by IEC on September 1, 2008
This part of IEC 60050 gives the general terminology used in the theory of electric and magnetic circuits, as well as general terms pertaining to circuit elements and their characteristics, to...
This document references:
IEC 61967-4 - Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Published by IEC on March 1, 2021
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
This document references:
IEC 61000-4-4 - Electromagnetic compatibility (EMC) – Part 4-4: Testing and measurement techniques – Electrical fast transient/burst immunity test
Published by IEC on April 1, 2012
This part of IEC 61000 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to...
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