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# IEC 61967-4

## Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method

active, Most Current
 Organization: IEC Publication Date: 1 March 2021 Status: active Page Count: 92 ICS Code (Integrated circuits. Microelectronics): 31.200
##### scope:

This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.

### Document History

IEC 61967-4
March 1, 2021
Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
June 1, 2017
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
A description is not available for this item.
July 1, 2006
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
April 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
April 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
A description is not available for this item.