IEC 61967-4
Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Organization: | IEC |
Publication Date: | 1 March 2021 |
Status: | active |
Page Count: | 92 |
ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.
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