Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
|Publication Date:||1 July 2006|
|ICS Code (Integrated circuits. Microelectronics):||31.200|
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.
IEC 61967-1 specifies general conditions and definitions of the test methods.