IEC 61967-4
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
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| Organization: | IEC |
| Publication Date: | 1 April 2002 |
| Status: | inactive |
| Page Count: | 80 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements.
IEC 61967-1 specifies general conditions and definitions of the test methods.
Document History
June 1, 2017
Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
A description is not available for this item.
July 1, 2006
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
April 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
A description is not available for this item.
IEC 61967-4
April 1, 2002
Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 4: Measurement of Conducted Emissions - 1 OHMS/150 OHMS Direct Coupling Method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...