CEI EN 62282-2
Integrated circuits - EMC Evaluation of transceivers Part 2: LIN transceivers
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| Organization: | CEI |
| Publication Date: | 1 October 2017 |
| Status: | active |
| Page Count: | 50 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 62228 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers
• the emission of RF disturbances,
• the immunity against RF disturbances,
• the immunity against impulses and
• the immunity against electrostatic discharges (ESD).
Document History
CEI EN 62282-2
October 1, 2017
Integrated circuits - EMC Evaluation of transceivers Part 2: LIN transceivers
This part of IEC 62228 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure...