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CEI EN IEC 62884-3

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Part 3: Frequency aging test methods

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Organization: CEI
Publication Date: 1 August 2018
Status: active
Page Count: 22
ICS Code (Piezoelectric devices): 31.140
scope:

This part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.

Document History

CEI EN IEC 62884-3
August 1, 2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Part 3: Frequency aging test methods
This part of IEC 62884 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator...

References

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