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NPFC - MIL-PRF-55310/31

OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHz THROUGH 200 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS

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Organization: NPFC
Publication Date: 12 March 2020
Status: active
Page Count: 7

Document History

MIL-PRF-55310/31
March 12, 2020
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHz THROUGH 200 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
A description is not available for this item.
MIL-PRF-55310/31
January 23, 2015
Oscillator, Crystal Controlled, Type 1 (Crystal Oscillator (XO)), 0.75 MHz Through 200 MHz, Hermetic Seal, Square Wave, Advanced CMOS
A description is not available for this item.
MIL-PRF-55310/31
April 19, 2010
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHz THROUGH 200 MHz, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
A description is not available for this item.
MIL-PRF-55310/31
October 11, 2006
OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 0.75 MHZ THROUGH 200 MHZ, HERMETIC SEAL, SQUARE WAVE, ADVANCED CMOS
A description is not available for this item.

References

This document references:
MIL-PRF-55310 - OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
Published by NPFC on March 12, 2020
Scope. This specification covers the general requirements for quartz crystal oscillators used in electronic equipment.
This document references:
MIL-STD-202-105 - Method 105, Barometric Pressure (Reduced)
Published by NPFC on January 21, 2020
A description is not available for this item.
This document references:
MIL-STD-202-204 - TEST METHOD STANDARD METHOD 204, VIBRATION, HIGH FREQUENCY
Published by NPFC on April 18, 2015
Purpose. The high frequency vibration test is performed for the purpose of determining the effect on component parts of vibration in the frequency ranges of 10 to 500 hertz (Hz), 10 to 2,000 Hz or 10...
This document references:
MIL-STD-202-211 - TEST METHOD STANDARD METHOD 211, TERMINAL STRENGTH
Published by NPFC on December 15, 2020
Purpose. This test is performed to determine whether the design of the terminals and their method of attachment can withstand one or more of the applicable mechanical stresses to which they will be...
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