CEI EN IEC 60749-17
Semiconductor devices - Mechanical and climatic test methods Part 17: Neutron irradiation
active, Most Current
Buy Now
| Organization: | CEI |
| Publication Date: | 1 October 2019 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test.
The objectives of the test are as follows:
a) to detect and measure the degradation of critical semiconductor device parameters as a function of neutron fluence, and
b) to determine if specified semiconductor device parameters are within specified limits after exposure to a specified level of neutron fluence (see Clause 6).
Document History
CEI EN IEC 60749-17
October 1, 2019
Semiconductor devices - Mechanical and climatic test methods Part 17: Neutron irradiation
The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to...
November 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
La presente Norma internazionale fa parte della serie IEC 60749 e descrive un metodo di prova mediante irradiazione ai neutroni.
Questa prova viene effettuata per determinare la tendenza al degrado...