DOD - SMD 5962-13212
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 16MBIT, RADIATION-HARDENED, NONVOLATILE RANDOM ACCESS MEMORY (NVRAM), MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 5 June 2020 |
| Status: | active |
| Page Count: | 26 |
scope:
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More
Document History
SMD 5962-13212
June 5, 2020
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 16MBIT, RADIATION-HARDENED, NONVOLATILE RANDOM ACCESS MEMORY (NVRAM), MONOLITHIC SILICON
Scope.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes...
February 1, 2019
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 16MBIT, RADIATION-HARDENED, NONVOLATILE RANDOM ACCESS MEMORY (NVRAM), MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
March 21, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 16MBIT, RADIATION-HARDENED, NONVOLATILE RANDOM ACCESS MEMORY (NVRAM), MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
December 17, 2013
MICROCIRCUIT, LINEAR, ULTRA LOW NOISE, PRECISION VOLTAGE REFERENCE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...