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BSI - BS IEC 62396-2 - TC

Tracked Changes (Redline) - Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems

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Organization: BSI
Publication Date: 27 February 2020
Status: active
Page Count: 99
ICS Code (Production. Production management): 03.100.50
ICS Code (Electronic components in general): 31.020
ICS Code (Aerospace electric equipment and systems): 49.060

Document History

BS IEC 62396-2 - TC
February 27, 2020
Tracked Changes (Redline) - Process management for avionics - Atmospheric radiation effects Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.

References

This document references:
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published by ASTM on October 1, 2011
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
This document references:
IEC 60749-44 - Semiconductor devices – Mechanical and climatic test methods – Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Published by IEC on July 1, 2016
This part of IEC 60749 establishes a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of...
This document references:
IEC 62396-1 - Process management for avionics – Atmospheric radiation effects – Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Published by IEC on January 1, 2016
This part of IEC 62396 is intended to provide guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the...
This document references:
IEC 62396-3 - Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
Published by IEC on September 1, 2013
This part of IEC 62396 provides guidance and furthermore it provides necessary requirements for those involved in the design of avionic systems and equipment and the resultant effects of atmospheric...
This document references:
JEDEC JESD 57 - Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
Published by JEDEC on December 1, 1996
This test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when...
This document references:
JEDEC JESD 89 - Test Method for Real-Time Soft Error Rate
Published by JEDEC on October 1, 2007
This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or...
This document references:
IEC 60749-38 - Semiconductor devices – Mechanical and climatic test methods – Part 38: Soft error test method for semiconductor devices with memory
Published by IEC on February 1, 2008
A description is not available for this item.
This document references:
IEC 62396-4 - Process management for avionics – Atmospheric radiation effects – Part 4: Design of high voltage aircraft electronics managing potential single event effects
Published by IEC on September 1, 2013
This part of IEC 62396 provides guidance on atmospheric radiation effects and their management on high voltage (nominally above 200 V) avionics electronics used in aircraft operating at altitudes up...
This document references:
IEC 62396-5 - Process management for avionics – Atmospheric radiation effects – Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
Published by IEC on August 1, 2014
The purpose of this part of IEC 62396 is to provide a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in...
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