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SNV - SN EN IEC 62228-3

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers

active, Most Current
Organization: SNV
Publication Date: 1 May 2019
Status: active
Page Count: 5
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

SN EN IEC 62228-3
May 1, 2019
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
A description is not available for this item.

References

This document references:
IEC 61000-4-4 - Electromagnetic compatibility (EMC) – Part 4-4: Testing and measurement techniques – Electrical fast transient/burst immunity test
Published by IEC on April 1, 2012
This part of IEC 61000 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to...
This document references:
IEC 61967-1 - Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General Conditions and Definitions
Published by IEC on December 1, 2018
This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description...
This document references:
IEC CISPR 16-1-1 - Specification for radio disturbance and immunity measuring apparatus and methods – Part 1-1: Radio disturbance and immunity measuring apparatus – Measuring apparatus
Published by IEC on May 1, 2019
This part of CISPR 16 specifies the characteristics and performance of equipment for the measurement of radio disturbance in the frequency range 9 kHz to 18 GHz. In addition, requirements are...
This document references:
ISO 10605 - Road vehicles - Test methods for electrical disturbances from electrostatic discharge AMENDMENT 1
Published by ISO on April 15, 2014
Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally...
This document references:
IEC 61967-4 - Integrated circuits – Measurement of electromagnetic emissions – Part 4: Measurement of conducted emissions – 1 Ω/150 Ω direct coupling method
Published by IEC on March 1, 2021
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
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