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DLA - SMD-5962-83017 REV J

MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 13 June 2022
Status: active
Page Count: 12
scope:

Scope.

This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD-5962-83017 REV J
June 13, 2022
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
Scope. This drawing describes device requirements for MIL-STD-883 compliant, non-JAN class level B microcircuits in accordance with MIL-PRF-38535, appendix A.
SMD 5962-83017
April 14, 2017
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes
SMD-5962-83017 REV G
July 6, 2005
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
SMD-5962-83017 REV F
February 5, 1992
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
This drawing describes device requirements for class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices"....
SMD-5962-83017 REV E
August 31, 1987
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-83017 REV D
March 17, 1987
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-83017 REV C
April 11, 1986
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-83017 REV B
September 24, 1985
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-83017 REV A
July 8, 1985
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-83017
January 16, 1984
MICROCIRCUIT, DIGITAL, LOW POWER, SCHOTTKY, TTL, DECODER/DEMULTIPLEXER, MONOLITHIC SILICON
A description is not available for this item.
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References

This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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