BSI - BS EN IEC 60749-37 - TC
Tracked Changes (Redline) - Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
active, Most Current
| Organization: | BSI |
| Publication Date: | 20 December 2022 |
| Status: | active |
| Page Count: | 60 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 60749-37 - TC
December 20, 2022
Tracked Changes (Redline) - Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
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