UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

- Trained on our vast library of engineering resources.

JEDEC - JESD22-A110E.01

Highly Accelerated Temperature and Humidity Stress Test (HAST)

active, Most Current
Organization: JEDEC
Publication Date: 1 May 2021
Status: active
Page Count: 14
scope:

The Highly Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. The stress usually activates the same failure mechanisms as the "85/85" Steady-State Humidity Life Test (JEDEC Standard No. 22-A101).

Document History

JESD22-A110E.01
May 1, 2021
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The Highly Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs...
July 1, 2015
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs...
November 1, 2010
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The Highly-Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs...
January 1, 2009
Highly Accelerated Temperature and Humidity Stress Test (HAST)
The purpose of this test method is to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs severe conditions of temperature, humidity, and bias that...
February 1, 1999
Test Method A110-B Highly-Accelerated Temperature and Humidity Stress Test (HAST)
A description is not available for this item.
April 1, 1997
Highly-Accelerated Temperature and Humidity Stress Test (HAST)
A description is not available for this item.
January 1, 1988
Test Method A110 Highly-Accelerated Temperature and Humidity Stress Test (HAST)
A description is not available for this item.

References

Advertisement