DOD - SMD 5962-99584
MICROCIRCUIT, LINEAR, DUAL, PULSE WIDTH MODULATION CONTROL CIRCUIT, MONOLITHIC SILICON
|Publication Date:||6 March 2012|
This specification covers the general requirements for established reliability, glass dielectric, fixed capacitors. Capacitors covered by this specification have failure rate levels (FRL) established in accordance with MIL-STD-690. These FRL are established at a 90 percent confidence level and maintained at a 10 percent producer's risk and are based on life tests performed with rated voltage applied at 125°C. An acceleration factor of 5:1 has been used to relate life test data obtained at 150 percent of rated voltage at 125°C to rated voltage at 125°C. A part per million (ppm) quality system is used for documenting and reporting the average outgoing quality of capacitors supplied to this specification. Statistical process control (SPC) techniques are required in manufacturing process to minimize variation in production of ER capacitors supplied to the requirements of this specification.
These capacitors are intended for use in any equipment where known orders of reliability are required, and are primarily designed as a substitute for mica-dielectric capacitors as a step toward... View More
These capacitors are intended for use in any equipment where known orders of reliability are required, and are primarily designed as a substitute for mica-dielectric capacitors as a step toward conservation of critical mica. They are effective substitutes for mica-dielectric capacitors and can be employed for many applications where mica-dielectric capacitors are used, provided consideration is given to the differences in temperature coefficient and dielectric loss. Capacitors covered by this specification are military unique due to the fact that these devices must be able to operate satisfactorily in military systems under the following demanding environmental conditions: shock, vibration, acceleration, extreme moisture, vacuum, extended life of 30,000 hours and more, and high operating temperatures such as experienced in missile-borne and space electronic equipment.View Less