CEI EN 60749-29
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
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| Organization: | CEI |
| Publication Date: | 1 May 2012 |
| Status: | active |
| Page Count: | 28 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Scope and object
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.
This test is classified as destructive.
The purpose of this test is to establish a method for determining integrated circuit (IC) latchup characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "no trouble found" (NTF) and "electrical overstress" (EOS) failures due to latch-up.
This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established.
The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2
Document History
CEI EN 60749-29
May 1, 2012
Semiconductor devices - Mechanical and climatic test methods Part 29: Latch-up test
Scope and object
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits.
This test is classified as destructive.
The purpose of this test is to...
November 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
La presente Norma internazionale fa parte della serie IEC 60749 e riguarda la prova di bloccaggio (l-test) e la prova di bloccaggio (interdizione) per sovratensione su circuiti integrati.
La prova...