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DLA - SMD-5962-93109

MICROCIRCUIT, DIGITAL, CMOS, HIGH INTEGRATION EMBEDDED PROCESSOR, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 12 May 1993
Status: active
Page Count: 24
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). The product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 80C186EB-8 High integration embedded processor 02 80C186EB-13 High integration embedded processor 03 80C186EB-16 High integration embedded processor

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style X CMGA5-P88 88 Ceramic, pin grid array

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Storage temperature range . . . . . . . . . . . . . . . . . −65°C to +150°C Supply voltage with respect to ground range . . . . . . . . −1.0 V dc to +7.0 V dc Voltage on any pin with respect to ground . . . . . . . . . −1.0 V dc to +7.0 V dc Maximum power dissipation (PD) . . . . . . . . . . . . . . . 0.5 W Lead temperature (soldering 10 seconds) . . . . . . . . . . 300°C Thermal resistance, junction-to-case (ΘJC): Case X . . . . . . . . . . . . . . . . . . . . . . . . . . See MIL-STD-1835 Maximum junction temperature . . . . . . . . . . . . . . . . 150°C

Case operating temperature range . . . . . . . . . . . . . . −55°C to +125°C Supply voltage, VCC . . . . . . . . . . . . . . . . . . . . 4.5 V dc ≤ VCC ≤ 5.5 V dc

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012) . . . . . . . 2/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

SMD-5962-93109
May 12, 1993
MICROCIRCUIT, DIGITAL, CMOS, HIGH INTEGRATION EMBEDDED PROCESSOR, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). The product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

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