JEDEC JESD 51-1
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
active, Most Current
Buy Now
| Organization: | JEDEC |
| Publication Date: | 1 December 1995 |
| Status: | active |
| Page Count: | 36 |
scope:
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form of electrical package. This method will provide a basis for comparison of different devices housed in the same electronic package or similar devices housed in different electronic packages.
Document History
JEDEC JESD 51-1
December 1, 1995
Integrated Circuit Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device)
The purpose of this test method is to define a standard Electrical Test Method (ETM) that can be used to determine the thermal characteristics of single integrated circuit devices housed in some form...
Related Products
Searching for related products...