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BSI - BS EN 15991

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

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Organization: BSI
Publication Date: 30 November 2015
Status: active
Page Count: 30
ICS Code (Raw materials): 81.060.10

Document History

BS EN 15991
November 30, 2015
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
A description is not available for this item.
February 28, 2011
Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)
A description is not available for this item.

References

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