DSF/FPREN 60749-28
IEC 60749-28 ED1: Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
| Organization: | DS |
| Status: | pending |
| Page Count: | 46 |
| ICS Code (Electrical and electronic testing): | 19.080 |
scope:
This part of IEC 60749 describes the direct contact charged device model (DC-CDM) for the electrostatic discharge test method which is used to evaluate the sensitivity of integrated circuits to electrostatic discharges. This test method can be used to reproduce and evaluate the effect of the discharge of a charged metal body to a semiconductor device. This test method described is for use on packaged devices. Where it is necessary to evaluate components that are shipped as wafers or bare chips, the components shall be assembled into a package similar to that expected in the final application. There are two types of CDM test methods, DC-CDM and field effect (F-CDM). The detailed specification shall state which test method is to be used. This test method is classified as destructive. NOTE - It is intended to describe the F-CDM test method in a separate part of the IEC 60749 series
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